New challenges in the testing of AESA Radars
29 Sept 2026
Abstract: AESA stands for Active Electronically Scanned Array, a type of radar technology used in modern radar systems. It handles a large volume of real-time data that needs to be digitized, streamed over high bandwidth communication links and stored and processed rapidly into information.
These features are creating a massive challenge on the test requirements such as:
• Requiring capture and reconstruction of high-volume, high-speed, and multi-input data
• Must include reconfigurable, software-defined bus test instruments for many bus types
• Many copper and fiber optics I/O connections need high performance, front-end switching
• Similar test requirements across product overall life cycle
This paper will present an ATE implementation to respond to this new testing challenge.
Speaker Biography: I hold an MSc in Digital Systems Engineering and joined Teradyne in 1996 with 4 years of experience in the industry. My first 26 years were spent in the Semiconductor Division as Field Product Specialist in Europe, contributing to our growth in most business segments including Commercial Analog/Digital, Memory, ADAS/Power Automotive, Banking/id Secure MCUs, NFC, Image Sensors. I recently joined the Defense and Aerospace Division in a similar role and with the same objective – taking on new challenges and delivering value-added solutions to our customers to secure their growth and success.
These features are creating a massive challenge on the test requirements such as:
• Requiring capture and reconstruction of high-volume, high-speed, and multi-input data
• Must include reconfigurable, software-defined bus test instruments for many bus types
• Many copper and fiber optics I/O connections need high performance, front-end switching
• Similar test requirements across product overall life cycle
This paper will present an ATE implementation to respond to this new testing challenge.
Speaker Biography: I hold an MSc in Digital Systems Engineering and joined Teradyne in 1996 with 4 years of experience in the industry. My first 26 years were spent in the Semiconductor Division as Field Product Specialist in Europe, contributing to our growth in most business segments including Commercial Analog/Digital, Memory, ADAS/Power Automotive, Banking/id Secure MCUs, NFC, Image Sensors. I recently joined the Defense and Aerospace Division in a similar role and with the same objective – taking on new challenges and delivering value-added solutions to our customers to secure their growth and success.
